Dang , T.M.L., Nguyen , N.Q., Bui , D.K., Duong , T.N., Ho , Q.T., Duong , V.T., Tran , T.H., Bui , T.A.D. and Pham , B.N. 2026. Characteristics of the reference X-ray narrow-spectrum series at SSDL of Institute for Nuclear Science and Technology. Nuclear Science and Technology. 12, 4 (May 2026), 23-28. DOI:https://doi.org/10.53747/nst.v12i4.387.