TRAN, T. T.; HOANG, T. H.; DUONG, T. T.; PARK, H.-S. A study of void fraction correlations used slip-ratio models. Nuclear Science and Technology, [S. l.], v. 12, n. 3, p. 34-44, 2024. DOI: 10.53747/nst.v12i3.394. Disponível em: http://jnst.vn/index.php/nst/article/view/394. Acesso em: 24 nov. 2024.