DANG , T. M. L.; NGUYEN , N. Q.; BUI , D. K.; DUONG , T. N.; HO , Q. T.; DUONG , V. T.; TRAN , T. H.; BUI , T. A. D.; PHAM , B. N. Characteristics of the reference X-ray narrow-spectrum series at SSDL of Institute for Nuclear Science and Technology. Nuclear Science and Technology, [S. l.], v. 12, n. 4, p. 23-28, 2026. DOI: 10.53747/nst.v12i4.387. Disponível em: http://jnst.vn/index.php/nst/article/view/468. Acesso em: 24 may. 2026.