LE, X. C.; DO, T. K. L.; LE, T. A.; NGUYEN, T. A.; TRAN, T. A.; MAI, V. D.; BUI, T. H.; PHAM, D. K.; NGUYEN, T. N.; TRAN, D. T. Thickness measurement of 10b and 11b targets using the alpha transmission method. Nuclear Science and Technology, [S. l.], v. 14, n. 3, p. 9-13, 2025. DOI: 10.53747/nst.v14i3.473. Disponível em: http://jnst.vn/index.php/nst/article/view/473. Acesso em: 26 jun. 2025.