Hoang MG, Hoang TH, Nguyen HT. Multi codes and multi-scale analysis for void fraction prediction in hot channel for VVER-1000/V392. Nucl. Sci. and Tech. [Internet]. 2015Sep.30 [cited 2024Nov.24];5(3):19-31. Available from: http://jnst.vn/index.php/nst/article/view/196