Characteristics of the reference X-ray narrow-spectrum series at SSDL of Institute for Nuclear Science and Technology

Dang Thi My Linh1, Ngoc Quynh Nguyen, Duc Ky Bui, Thi Nhung Duong, Ho Quang Tuan2, Duong Van Trieu2, Tran Thanh Ha2, Bui Thi Anh Duong2, Pham Bao Ngoc2
1 Institute for Nuclear Science and Technology
2 Institute for Nuclear Science and Technology, VINATOM

Main Article Content

Abstract

This paper presents the characteristics of the reference X-ray narrow-spectrum series used in the Secondary Standard Dosimetry Laboratory (SSDL) at Institute for Nuclear Science and Technology (INST) with X-ray beam irradiator. In order to perform calibration works, it is highly important to verify the characteristics and qualities of reference X-ray beam recommended by the International Standardization Organization (ISO) 4037:2019. The characteristics of the X-ray beams in terms of the half-value layer, homogeneity coefficient and the air kerma rate are determined for the narrow-spectrum series in the 40 and 150 keV range. The related dosimetric quantities such as the ambient dose equivalent and personal dose equivalent also determined. The experimental values are well consistent with the recommended values of the ISO 4037 criteria. It implies that the reference X-ray narrow-spectrum series (N-series) can be applied in calibration works of X-ray measuring devices used in radiation safety assessment.

Article Details

Author Biographies

Ho Quang Tuan, Institute for Nuclear Science and Technology, VINATOM

179 Hoang Quoc Viet, Hanoi, Vietnam

Duong Van Trieu, Institute for Nuclear Science and Technology, VINATOM

179 Hoang Quoc Viet, Hanoi, Vietnam

Tran Thanh Ha, Institute for Nuclear Science and Technology, VINATOM

179 Hoang Quoc Viet, Hanoi, Vietnam

Bui Thi Anh Duong, Institute for Nuclear Science and Technology, VINATOM

179 Hoang Quoc Viet, Hanoi, Vietnam

Pham Bao Ngoc, Institute for Nuclear Science and Technology, VINATOM

179 Hoang Quoc Viet, Hanoi, Vietnam

References

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